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Laboratory equipment Linz

 

Glow discharge optical emission spectroscopy, GD Profiler 2

In glow discharge optical emission spectroscopy HF (GDOES-HF), argon atoms are ionised in a hollow anode via high frequencies and accelerated in the direction of the sample (cathode). This results in a continuous stream of atoms impacting with and stimulating the sample surface. Upon the transition back to the base state, light characteristic of each element is emitted and measured. A depth profile analysis is made possible through the continuous removal of material.

Area of application:

  • Characterisation of surfaces (quantitative depth profile analysis)
  • Determination of material composition (bulk analysis)
  • Available elements: Ag, Al, Au, B, Ba, Bi, C, Ca, Cl, Co, Cr, Cu, F, Fe, H, In, Ir, K, Li, Mg, Mn, Mo, N, Na, Nb, Ni, O, P, Pb, Pd, Pt, S, Sb, Si, Sn, Ta, Ti, V, W, Zn, Zr;

Specifications:

  • Quantification with certified standards
  • Simultaneous analysis of 41 (+1)* elements
  • *Monochromator for the analysis of an additional element
  • Bulk analysis (ppm range)
  • HF stimulation of conductive and non-conductive samples
  • HDD – High dynamic range detector

Depth profile analysis:

  • Sputter rate correction
  • Depth resolution approx. 10%
  • Depth range: (10) 50 nm – 190 µm

Sample requirements:

  • Analysis area: 2 or 4 mm diameter
  • Sample diameter: > 15 mm
  • Sample chamber for smaller samples > 2 mm
  • Sample thickness: up to 40 mm
  • Level surface
  • Low roughness
  • “Dense” sample

Applications:

  • Inspection of surface coatings
  • Inspection of surface treatments
    Pickling, nitriding, phosphating, etc.
  • Investigation of diffusion zones
  • Corrosion investigations - inspection of corrosion protection measures
  • Quality control

 

Contact person: Palczynski Gregor
Manufacturer:Horiba JobinYvon
Year of manufacture:2007

Device categories:
Optical
Materials
Surfaces
Destructive
Stationary
Metal
Ceramics
Analysis