LEIS is a new and highly sensitive surface characterization technique. This enables the determination of the outermost atomic layer of materials, quantifying elemental composition with extremely accurate precision. In conjunction with precision sputtering, LEIS can also provide cross-sections and layer-by-layer analysis. This is highly interesting for various applications and material investigations in e.g. semiconductor industry, corrosion or catalysis and can be performed at CEST since this year.

There are currently about 20 such analyzers in the world, and CEST is the only one in Austria that is already delivering great results in our projects. This new technology, as well as our instrument, is of course open to all our partners, as well as to the industry, to raise surface characterization to a new level and to find solutions for industrial problems. Contact us if you want to learn more about the great potential of this technology.

Our laboratory equipment
Details about LEIS
Contact us for analytical questions

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