- AFM – Atomic Force Microscope
- Climate chamber
- Clocked rectifier, various types
- Contact angle measurement system
- Electrochemical methods various types and methods e.g: impedance spectroscopy, cyclic voltammetry or electrochemical noise (ECN)
- FIB – Focused Ion Beam
- FTIR – Spectroscopy
- Electroplating pilot equipment, various types
- Glovebox
- ICP-OES
- IR Spectroscopy – IRRAS
- Kelvin probe
- Laserpuller
- Mass spectrometry
- Metallographic equipment
- Nano fibre electro spinner
- Optical microscope with camera system (various types)
- Optical glow discharge GD-OES
- Polarography
- Potentiostat-Galvanostat, (various types)
- Puls Reverse Power Source (various types)
- RAMAN – Spectroscopy
- Salt spray chamber (various types)
- SEM – (with EDX) – scanning electron microscope
- UV/VIS Spectroscopy
- Vickers hardness test
- Wet blasting machine
- XRD – x-ray diffraction
- XRF (x-ray fluorescence analysis)
